Bruker Quantax EDS for TEM

eds microanalisi Bruker per TE;M

The new generation of QUANTAX EDS features the XFlash® 6T detector series with active areas of 30 mm2 and 60 mm2 for TEM and STEM.

Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results:

  • Save time – new slim-line technology detectors, large area SDDs, and high performance pulse processing get the job done faster
  • Save effort – motorized detector movement and light weight design make detector handling easier. Low electromagnetic and mechanical interference minimize the influence on instrument performance
  • Gain precision – best energy resolution provides the highest quality spectra for precise analysis
  • Gain reliability – the world’s most comprehensive atomic database ensures correct peak identification also at low energy
  • Gain accuracy –  sophisticated algorithms for quantification provide accurate results
  • Gain information – integration with complimentary techniques, such as EELS, is supported

Here you can find the technical details for Quantax for TEM

Here you can find our Scanning Electron Microscopes (SEM)

Here you can find our Transmission Electron Microscopes (TEM)

Here you can find our reconditioned electron microscopes

Here you can find our consumables

Here you can find our EBSD detectors

Here you can find our WDS detectors

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