The Elite T is the next generation EDS system for transmission electron microscopy (TEM) utilizing a fast SDD with state-of-the-art integrated electronics. The unique geometry and powerful quantification routines of the Elite T provide optimized analysis solutions for all TEM applications.
The design of the Elite T EDS System provides an optimized geometry to ensure the best possible performance. Solid angles of greater than 2 steradians (sr) are achievable with the dual detector option for select TEM models, which increases count rates and ensures faster data collection on sensitive samples.
The Elite T detectors are designed specifically not to require the typical protective window in front of the module. This design:
- Improves the light element sensitivity of the detector
- Enhances the mapping speed and light element detection in low concentrations
- Allows flexibility of sensor placement for maximum exposure to the signal
TEAM™ Software Suite allows users to optimize their analysis time and get the best possible data from their sample
- Smart Quant – several powerful quantification routines are implemented in the TEAM™ software
- Smart Track – ensures optimal working conditions on setup
- EXpert ID – revolutionary one-step peak identification program
- Smart Mapping – automatically determines collection time required, and identifies the elements present in the sample
- Smart Drift – monitors and dynamically adjusts parameters to account for drift changes
- Smart Data Management – increases ease of use and provides simple file management
Here you can find the technical details for the EDS Elite T detector
Here you can find our Scanning Electron Microscopes (SEM)
Here you can find our Transmission Electron Microscopes (TEM)
Here you can find our reconditioned electron microscopes
Here you can find our consumables
