The EM-Tec CXS calibration and reference standards are designed for calibration, resolution testing and performance testing. Each standard contains a selection of reference materials, in the form of element or compounds, optimized for specific calibration tasks.They are available as compact Ø 12.7mm pin stubs and Ø25.4mm discs:
- Compact Ø12.7mm standard aluminium pin stub with up to 10 elements/compounds.
- Ø25.4 mm AISI303 stainless steel block (9mm height) for larger numbers of element / compounds. Compatible with the EM-Tec M26 metallographic mount holders and the EM-Tec reference holders.
The elements/compounds are all mounted with highly conductive and vacuum compatible silver filled epoxy. The mounts are then polished to ensure that all the elements/compounds are in the same plane. Virtually all standards include a Faraday cup to enable electron probe measurements and monitoring. The calibration standards with non-conductive elements/compounds are carbon coated to ensure conductivity and avoid charging.
The pin stub type standards are compatible with FEI, Philips, Zeiss, LEO, TESCAN, Phenom, Aspex, Leica, Cambridge instrument and CamScan SEMs.
The EM-Tec calibration and reference standards are intended for calibration and testing of:
- SEM / EDS systems and/or SEM / WDS systems
- SEM back scattered electron detector (BSD)
- SEM / GSR (gunshot residue) analysis
- SEM particle analysis systems
- SEM cathode-luminescence (CL) detector
- SEM / Raman system
- SEM / micro-XRF systems
- micro-XRF systems
# 36-000505 EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5F calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test.
Reference materials: Stainless steel (SRM 1155), SiO2, Mn, B and C. 200µm copper Faraday cup.
EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub | |
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Product # | Unit |
36-000505 | each |
#36# 36-000506 EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub
The EM-Tec CXS-5C calibration standard includes 5 reference materials and a 200mesh copper grid All mounted in a compact Ø12.7mm standard aluminium pin stub. The 200mesh copper grid acts as an image size reference and with the aluminium pin stub it serves as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test.
Reference materials: Stainless steel (SRM 1155), SiO2, Mn, B and C. 200mesh copper grid.
EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub | |
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Product # | Unit |
36-000506 | each |
#36-000507 EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5BE calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up.
Reference materials: Au, Nb, Ge, Si and C. 200µm copper Faraday cup.
EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub | |
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Product # | Unit |
36-000507 | each |
#36-000522 EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub
The EM-Tec CXS-6BE calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up.
Reference materials: Au, Rh, Ge, Co, Si and C. 200µm copper Faraday cup.
EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub | |
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Product # | Unit |
36-000522 | each |
#36-000510 EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub
The EM-Tec CXS-10BE calibration standard includes 10 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up.
Reference materials: Bi, Ir, Ho, Sn, Nb, Ge, Co, Ti, Si and C. 200µm copper Faraday cup.
EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub | |
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Product # | Unit |
36-000510 | each |
#36-000508 EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5N calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test. Similar to #36-00505; EM-Tec CXS-5F, but with BN instead of B to add N.
Reference materials: Stainless steel (SRM 1155), SiO2, Mn, BN and C. 200µm copper Faraday cup.
EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub | |
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Product # | Unit |
36-000508 | each |
#36-000512 EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5LE calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: light element performance test and EDS detector setup; includes: B, C, N, O and F in stable compounds.
Reference materials: CaB6, SiC, CrN, Fe2O3 and CaF2. 200µm copper Faraday cup.
EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub | |
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Product # | Unit |
36-000512 | each |
#36-000513 EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5TX calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard stainless steel pin stub. The copper Faraday cup can be used to measure beam current and to monitor beam stability. Intended for: setting up EDAX detectors and EDS systems for 1-20KeV.
Reference materials: Si, Cr, Fe, Ni and Mo. 200µm copper Faraday cup.
EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub | |
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Product # | Unit |
36-000513 | each |
#36-000514 EM-Tec CXS-5LX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5LX calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: setting up EDAX detectors and EDS systems including light elements.
Reference materials: Mo, Cu, SiO2, BN and C. 200µm copper Faraday cup.
EM-Tec CXS-5LX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub | |
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Product # | Unit |
36-000514 | each |
#36-000517 EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub
The EM-Tec CXS-6F calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution and EDS detector calibration.
Reference materials: Cu, Mn, Ti, CaCo3, B and C. 200µm copper Faraday cup.
EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub | |
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Product # | Unit |
36-000517 | each |
#36-000521 EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub
The EM-Tec CXS-6LE calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test.
Reference materials: Stainless steel 316, Mn, Ti, CaCo3, PFTE and BN. 200µm copper Faraday cup.
EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub | |
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Product # | Unit |
36-000521 | each |
#36-000525 EM-Tec CXS-10GSR EDS/GSR calibration standard, 10 materials plus F/C on pin stub
The EM-Tec CXS-10GSR calibration standard includes 10 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Sb, Ba and Pb are supplied in a stable form. Intended for: GSR software calibration, EDS detector set-up, EDS peak calibration and BSD detector set-up
Reference materials: C, Si, Mn, Co, SrF3, Rh, Sb, BaSO4, PbCO3 and SRM 1155 (AISI 316). 200µm copper Faraday cup.
EM-Tec CXS-10GSR EDS/GSR calibration standard, 10 materials plus F/C on pin stub | |
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Product # | Unit |
36-000525 | each |
#36-000618 EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on stainless steel Ø25.4 x 9 mm disc
The EM-Tec RXS-18RE reference standard includes 18 reference rare earth elements and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9 mm AISI 303 stainless steel disc. Intended as reference standard for quantitative EDS and WDS micro-analysis applications.
Reference materials: LaF3, Ceo2, Pr, Nd, Sm, EuF3, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Sc, Y, U and C. 200µm copper Faraday cup. Sensitive to air, must be stored under vacuum or inert gas.
EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on stainless steel Ø25.4 x 9 mm disc | |
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Product # | Unit |
36-000618 | each |
#36-000621 EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on stainless steel disc, Ø25.4 x 9 mm
The EM-Tec RXS-21RE reference standard includes 21 reference rare earth elements and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9 mm AISI 303 disc. Intended as reference standard for quantitative EDS and WDS micro-analysis applications.
Reference materials: LaF3, Ceo2, PrSi2, NdSi2, Sm, EuF3, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Gd3Ga5O12, Sc, Y, U, ThF4, B and C. 200µm copper Faraday cup. Preferably stored under vacuum or inert gas.
EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on stainless steel disc, Ø25.4 x 9 mm | |
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Product # | Unit |
36-000621 | each |
#36-000636 EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on stainless steel disc, Ø25.4 x 9 mm
The EM-Tec RXS-36M metals reference standard includes 36 reference metal standards and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9 mm AISI 303 stainless steel disc. Intended as reference standard for quantitative EDS and WDS micro-analysis applications.
Reference materials: Be, C, Al, Si, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ge, Se, Sc, Y, Zr, Mo, Nb, Sn, Sb, Ru, Rh, Pd, Ag, PbTe, Hf, Ta, W, Re, Os, Ir, Au, Bi, and Pt. 200µm copper Faraday cup.
EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on stainless steel disc, Ø25.4 x 9 mm | |
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Product # | Unit |
36-000636 | each |
#36-000638 EM-Tec RXS-36MC metals reference standard, 36 metals/compounds plus F/C on stainless steel disc, Ø25.4 x 9 mm
The EM-Tec RXS-36MC materials reference standard includes 36 reference metal/compound standards and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9 mm AISI 303 stainless steel disc. Intended as reference standard for quantitative EDS and WDS micro-analysis applications. Carbon coated to ensure conductivity.
Reference materials: B, C, MgO, Al2O3, Si, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, GaP, SrF2, Zr, Nb, Mo, Pd, Ag, Cd, InAs, Sn, Sb, BaF2, Ha/Ta, W, Pt, Au, PbTe and Bi. 200µm copper Faraday cup.
EM-Tec RXS-36MC metals reference standard, 36 metals/compounds plus F/C on stainless steel disc, Ø25.4 x 9 mm | |
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Product # | Unit |
36-000638 | each |
#36-000640 EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on stainless steel Ø 25.4 mm pin stub
The EM-Tec RXS-40MC minerals reference standard includes 40 reference minerals and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 mm pin stub, made from AISI 303 stainless steel. This standard is carbon coated for conductivity. The stoichiometric compositions of these natural minerals are nominal; other impurities or small inclusions may be present. Intended as reference standard for quantitative EDS and WDS micro-analysis applications. 200µm copper Faraday cup and 40 minerals:
1 Albite A NaALSi3O8 | 21 Magnetite Fe3O4 |
2 Albite B NaALSi3O8 | 22 Cuprite Cu2O |
3 Pyrite FeS2 | 23 Chrysoberyl (synthetic) Be3Al2O4 |
4 Marcasite FeS2 | 24 Wulfenite PbMoO4 |
5 Wurtzite (Zn, Fe)S | 25 Cerrusite PbCO3 |
6 Siderite FECO3 | 26 Vanadinite [Pb(VO4)3]Cl |
7 Marmarite (Zn, Fe)S | 27 Apatite Ca5(PO4)3(F,Cl,OH) |
8 Aragonite CaCO3 | 28 Casserite SnO2 |
9 Calcite CaCO3 | 29 Celestite SrSO4 |
10 Barytes BaSO4 | 30 Rutile TiO2 |
11 Benitoite BaTiSi3O9 | 31 Anastase TiO2 |
12 Fluorite CaF2 | 32 Brookite TiO2 |
13 Dolomite (CaMg)(CO3)2 | 33 Gypsum CaSO4.2H2O |
14 YAG (synthetic) Y3Al5O12 | 34 Baddeleyite ZrO2 |
15 Perovskite CaTiO3 | 35 Zirconia (synthetic) ZrO2 (8 mole% Y2O3) |
16 Sphene CaTiSiO5 | 36 Beryl (Be3Al2(SiO3)6) |
17 Scheelite | 37 Adularia (KAlSiO3O8) |
18 Tausonite (synthetic) SrTiO3 | 38 Quartz SiO2 |
19 Enargite Cu3AsS4 | 39 Spinel (synthetic) MgAl2O4 |
20 Haemetite Fe2O3 | 40 Corundum Al2O3 |
EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on stainless steel Ø 25.4 mm pin stub | |
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Product # | Unit |
36-000640 | each |
#36-000642 EM-Tec RXS-40MM metals & mineral reference standard, 40 standards plus F/C on stainless steel Ø 25.4 mm pin stub
The EM-Tec RXS-40MM metals & minerals reference standard includes 40 standards and a 200µm aperture copper Faraday cup. The standards are: 27 reference metals, 5 compounds and 8 minerals. All mounted in a Ø25.4 mm standard pin stub, made from AISI 303 stainless steel. The standard is carbon coated for conductivity. The stoichiometric compositions of the natural minerals are nominal; other impurities may be present. Intended as reference standard for quantitative EDS and WDS micro-analysis applications with the following elements: Ag, Al, As, Au, Ba, Bi, Ca, Ce, Cl, Co, Cr, Cu, F, Fe, Ga, Ge, Hf, In, K, Mg, Mn, Mo, Na, Nb, Ni, P, Pb, Pt, Re, Rh, S, Sb, Se, Si, Sn, Ta, Te, Ti, V, W, Y, Zn, Zr
5 compounds & 8 minerals:
CaF2 |
CeO2 |
GaAs |
InP |
PbTe |
28 Baryte BaSO4 |
29 Pyromorphite Pb5(PO4)3Cl |
31 Haemetite Fe2O3 |
32 Pyrite FeS2 |
35 Adularia KAl2Si3O8 |
36 Spinel (synthetic) MgAl2O3 |
37 YAG (synthetic) Y3Al5O12 |
39 Albite NaALSi3O8 |
EM-Tec RXS-40MM metals & mineral reference standard, 40 standards plus F/C on stainless steel Ø 25.4 mm pin stub | |
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Product # | Unit |
36-000642 | each |
#36-000644 EM-Tec RXS-40MC+CL mineral + cathode luminescence reference standard, 40 minerals plus F/C on stainless steel pin stub, Ø25.4 mm
The EM-Tec RXS-40MC+CL minerals reference standard includes 40 reference minerals and a 200µm aperture copper Faraday cup. EDS spectra, cathode luminescence spectra and quantitative EDS analysis results are provided for each mineral. All minerals are mounted in a Ø25.4 mm pin stub, made from AISI 303 stainless steel. The standard is coated coated for conductivity. The stoichiometric compositions of these natural minerals are nominal; other impurities or small inclusions may be present. Intended as reference standard for CL set-up and test, quantitative EDS and WDS micro-analysis applications. 200µm copper Faraday cup and 40 minerals:
1 Albite A NaALSi3O8 | 21 Strontium titanite SrTiO3 |
2 Anhydrite CaSO4 | 22 LaF3 |
3 Anorthite CalAl2Si2O8 | 23 Pezzottaite Cs(Be2Li)Al2Si6O18 |
4 Apatite Ca5(PO4)3 | 24 ThF4 |
5 Aragonite CaCO3 | 25 MgO |
6 Baddeleyite ZrO2 | 26 Pyromorphite Pb5(PO4)3Cl |
7 Barite BaSO4 | 27 Quartz SiO2 |
8 Benitoite BaTiSi3O9 | 28 Scheelite CaWO4 |
9 Beryl Be3Al2(SiO3)6 | 29 Sodalite Na8(Al6Si6O24)Cl2 |
10 Calcite CaCO3 | 30 Spinel MgAl2O4 |
11 Cassiterite SnO2 | 31 Spodumene LiAl(SiO3)2 |
12 Celestine SrSO4 | 32 Strontionite SrCO3 |
13 Crysoberyl BeAl2O4 | 33 Sphene CaTiSiO5 |
14 Corundum Al2O3 | 34 Wollastonite CaSiO3 |
15 Kutnohorite Ca(Mn)(CO3)2 | 35 YAG (synthetic) Y3Al5O12 |
16 Diopside CaMgSi2O6 | 36 Zircon ZrSiO4 |
17 Dolomite (CaMg)(CO3)2 | 37 Zirconia (ZrO2 + 10% Y2O3 |
18 Feldspar KAlSi3O8 | 38 CdS |
19 Fluorite CaF2 | 39 SrF2 |
20 Hambergite Be2BO3(OH) | 40 ZnS |
EM-Tec RXS-40MC+CL mineral + cathode luminescence reference standard, 40 minerals plus F/C on stainless steel pin stub, Ø25.4 mm | |
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Product # | Unit |
36-000644 | each |
#36-000707 EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub
The EM-Tec RXS-7CL test standard includes 7 reference compounds. All mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for testing cathode-luminescence detector and spectrometer performance.
Reference materials: Benitoite, Chrysoberyl, Apatite, Fluorite, Spinel, Calcite and Corundum.
EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub | |
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Product # | Unit |
36-000707 | each |
#36-000710 EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub
The EM-Tec RXS-10PD peak deconvolution test standard includes 10 reference compounds and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for testing EDS and WDS spectrometer performance and as reference with overlapping materials.
Reference materials: Molybdenite (MoS2), Zinkenite (Pb9Sb22S42), Galena (PbS), Cinnabar (HgS), Wulfrenite (PbMoO4), Benitoite (BaTiSiO9), Galkhaite ((Cs,Tl)(Hg, Cu, Zn)6(As)4S12+trace Sb, Kleinite (Hg2N(ClSO4).n(H2O), Kosnarite (KZr(PO)3) and Enargite (Cu3AsS4). 200µm copper Faraday cup.
EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub | |
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Product # | Unit |
36-000710 | each |
#36-000711 EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub
The EM-Tec RXS-10RA reference standard includes 10 reference compounds and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for performance testing for Raman mineral analysis.
Reference materials: Silica, Quartz, Aragonite, Calcite, Chalcedony, Pyrite, Marcasite, Rutile, Anastase and Brookite. 200µm copper Faraday cup.
EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub | |
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Product # | Unit |
36-000711 | each |
#36-000712 EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si on pin stub
The EM-Tec RXS-2WSi contrast test standard includes fused W and Si. Mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for resolution and X-ray versus Z-contrast testing and optimizing of SEM/EDS or SEM/WDS parameters.
Reference materials: Fused W / Si.
EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si on pin stub | |
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Product # | Unit |
36-000712 | each |
#36-000714 EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si on pin stub
The EM-Tec RXS-2TaSi contrast test standard includes fused Ta and Si. Mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for resolution and X-ray versus Z-contrast testing and optimizing of SEM/EDS or SEM/WDS parameters.
Reference materials: Fused Ta / Si.
EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si on pin stub | |
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Product # | Unit |
36-000714 | each |