TEM samples are very thin and therefore don’t exhibit signal originating from bulk. This enables improved surface imaging and increased spatial resolution. These are clear advantages for SEM/EDX studies of thin films, fine dispersions, inclusions, precipitations and low-Z materials. An SEM or rather FESEM can also be used to check TEM samples or lamellas made with a FIB before inserting in a TEM.
There are two methods of imaging TEM samples and they require differetn type of TEM grid holders:
- surface imaging and investigation require TEM grid holders
- STEM imaging which requires a special TEM grid holder with integrated conversion plate
EM-Tec TEM grid holders for surface imaging and EDX analysis with an SEM
The EM-Tec TEM grids holders enables investigating TEM samples in the SEM. The EM-Tec grid holder can also be used to quickly check the sample (after FIB procedures) before investigating it with a TEM. The EM-Tec grid holders are intended for use in an SEM, Auger, SIMS and light microscopes. They are all precision machined from vacuum grade aluminium. There are three types EM-Tec of TEM grid holders:
- EM-Tec TG4 pin stubbased TEM grid holder for up to four TEM grids. Numbered positions with machined pockets and side grooves for loading/unloading the TEM grids. The TEM grids are clamped down by the top plate and a central brass screw. Through hole size is Ø2.1mm with a 60° side angle on top and base to reduce electron and X-ray scattering interference from the holder. Available in aluminium and copper. Overall size is Ø18×3.2mm with a 15mm long standard 3.2mm pin. The longer pin creates a distance from the stage adapter to reduce electron and X-ray signals from the SEM stage. Additionally available with stub adapters for Hitachi M4 thread and JEOL Ø 12.2 and Ø 25mm stubs.
- EM-Tec PS11 mini pin stub holder for a single TEM or FIB grid. TEM grid rim rests on a ledge; in the middle of the cavity there is dimple to provide a non-touching area for the mesh of the grid. Groove is provided for easy loading/unloading of the TEM grid with fine tweezers. The TEM grid is not clamped. This holder is used for quickly checking a TEM grid in the SEM or as a TEM grid holder for a carbon evaporator.
- EM-Tec PS14 mini pin stub holder for four TEM or FIB grids. TEM grid rim rests on a ledge; in the middle of each cavity there is dimple to provide a non-touching area for the mesh of the grid. Grooves are provided for easy loading/unloading of the TEM grids with fine tweezers. The TEM grids are not clamped. This holder is used for quickly checking up to four TEM grids in the SEM or as a grid holder for a carbon evaporator.
All three EM-Tec TEM grid holders are only available with a standard 3.2mm pin. They can be used on other SEMs, when an EM-Tec SEM stub adapter is used.
 | EM-Tec TG4 TEM grid holder securely holds up to 4 TEM grids, Ø18×3.2mm, aluminium, pin |
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Product # | Unit |
12-000279 | each |
 | EM-Tec TG4C TEM grid holder securely holds up to 4 TEM grids, Ø18×3.2mm, copper, pin |
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Product # | Unit |
12-002279 | each |
 | EM-Tec TG4H TEM grid holder securely holds up to 4 TEM grids, Ø18×3.2mm, aluminium, with M4 stub adapter |
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Product # | Unit |
12-000379 | each |
 | EM-Tec TG4J TEM grid holder securely holds up to 4 TEM grids, Ø18×3.2mm, aluminium, with JEOL Ø12.2mm stub adapter |
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Product # | Unit |
12-000579 | each |
 | EM-Tec TG4J2 TEM grid holder securely holds up to 4 TEM grids, Ø18×3.2mm, aluminium, with JEOL Ø25mm stub adapter |
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Product # | Unit |
12-005279 | each |
 | EM-Tec PS11 mini pin stub grid holder for 1 x TEM grid, Ø12.7×3.2mm, pin |
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Product # | Unit |
10-002211 | each |
 | EM-Tec PS14 mini pin stub grid holder for 4 x TEM grids, Ø12.7×3.2mm, pin |
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Product # | Unit |
10-002214 | each |
 | EM-Tec ST1 STEM imaging holder for TEM/FIB grids, pin |
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Product # | Unit |
12-000280 | each |
 | EM-Tec ST1 STEM imaging holder for TEM/FIB grids, M4 |
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Product # | Unit |
12-000380 | each |