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EPMA – SXFive

Micro analizzatore di sonde elettroniche per materiali e geoscienze
Electron Probe Micro Analyzer for Materials & Geoscience

Combining advanced electron optics, state-of-the-art spectrometer design and dedicated software, the SXFive performs high accuracy qualitative and quantitative chemical microanalysis in geochemistry, mineralogy, geochronology, physical and nuclear metallurgy, material sciences (including cements, glass, ceramics …), biochemistry as well as microelectronics.

Optimized electron column
The SXFive comes equipped with a versatile electron gun compatible with W and LaB6. The beam current is continuously regulated, achieving a stability of 0.3% per 12 hours, thus enabling reliable long term quantitative analyses. The beam intensity is accurately measured thanks to an annular Faraday cup and electrostatic deflection. The high voltage system operates at up to 30 kV for elements with high atomic number. High intensity beam currents (several µA) may be used for trace element measurements and high speed X-ray mapping.
The SXFive can be upgraded with a Field Emission source.

The finest Wavelength Dispersive Spectrometers (WDS)
Wavelength Dispersive Spectrometry is acknowledged as the method of choice for high precision quantitative analysis. Up to 5 WDS spectrometers, plus one energy dispersive spectrometer EDS, may be fitted to the SXFiveFE microprobe. Optical encoders ensure the accurate positioning of the spectrometers which can be mounted vertically for flat and polished specimens or may be inclined for rough specimens. High sensitivity crystals allow a nearly three-fold increase in count rate while maintaining peak to background ratio and spectral resolution, and keeping the full spectrometer analysis range, making the SXFive and SXFiveFE instruments of choice for the analysis of trace and light elements.

Fully integrated optical microscope for easy sample navigation
Using a digital CCD camera, opaque specimens are viewed in reflected light while thin sections are imaged in transmitted light. The Field Of View of the optical image is continuously variable from 250 to 1700 µm thanks to a motorized lens, and an autofocus system guarantees that the specimen surface returns to the correctly focused position at any time.

Dedicated automation and analysis software package
The SXFive is equipped with the latest imaging X-ray acquisition, PC automation under the latest Windows version and user interface technology. Automation has been enhanced for maximum efficiency and unattended analysis.

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Since 1998, Media System Lab has focused its attention on Quality Research and Attention to Customer needs

Contact us to learn more about EPMA – SXFive

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