EDAX EDS Octane Elect

The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage microanalysis.

The Octane Elect SDDs incorporate a silicon nitride (Si3N4) window, high speed electronics and a manual slide. They can be combined with one of EDAX’s Electron Backscatter Diffraction (EBSD) cameras as part of the Pegasus EDS-EBSD Analysis System, providing seamless integration for both elemental composition and crystal structure analysis in one easy-to-use package.

The Octane Elect SDDs are available in 2 models:

  • Octane Elect Plus – 30 mm2 chip
  • Octane Elect Super – 70 mm2 chip
Best Light Element Performance

The Octane Elect SDD with a Si3N4 window offers major transmission improvements compared to detectors with a polymer window, leading to greatly improved light element performance and significantly more critical data for the materials analyst.

Low kV Performance

The mechanical properties of silicon nitride allow the use of thinly fabricated windows with a low aspect ratio support grid, offering a great benefit in terms of low energy sensitivity and optimal low voltage analysis.

Optimized SDD Electronics for stable energy at high collection rates
  • Fast pulse processing for mapping and quantification
  • Optimized data quality at all count rates
  • High resolution quantitative analysis at mapping speeds greater than 400,000 output cps

The EDAX EDS systems with advanced detection electronics offer the highest throughput count rate on the market for the best possible analysis and increased productivity.


The design of the SDDs with the material properties and durability of the Si3N4 window offer the most robust and reliable detectors for all EDS applications. The unique design means that they are corrosion and shock resistant, and suitable for plasma cleaning.

Resolution127 eV @ Mn K
Carbon detection>500 k cps for ultra fast mapping and particle acquisition
Detection rangeAL L (73 eV) – Am
Throughput700 k ocps @ 1.6 M icps
Al L to Al K peak height ratio of 1:1 at 2.5 kV ✔️
Standard EDS software analysis✔️
Fast Phase Mapping routine (patent pending) and materials libraries – Smart Diagnostics – Smart Acquisition – EXpert ID – Smart Mapping – Smart Data Management✔️

Here you can find the technical details for the EDS Octane Elect detector

Here you can find our Scanning Electron Microscopes (SEM)

Here you can find our Transmission Electron Microscopes (TEM)

Here you can find our reconditioned electron microscopes

Here you can find our consumables

Here you can find our EBSD detectors

Here you can find our WDS detectors

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