The game changing advancements in the Octane Elite SDDs take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite EDS System also uses state of the art electronics, which yield high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
The Octane Elite SDDs incorporate a silicon nitride (Si3N4) window, high speed electronics and a motorized slide. They can be combined with one of EDAX’s Electron Backscatter Diffraction (EBSD) cameras and/or Wavelength Dispersive Spectrometry (WDS) detectors as part of the TEAM™ Pegasus EDS-EBSD Analysis System or TEAM™ Trident EDS-EBSD-WDS Analysis System for a complete materials characterization solution.
The Octane Elite SDDs are available in 2 models:
Octane Elite Plus – 30 mm2 chip
Octane Elite Super – 70 mm2 chip
Best Light Element Performance
The silicon nitride window offers major improvements compared to a polymer window, leading to greatly improved light element performance and significantly more critical data for the analyst.
The silicon nitride window offers superior low energy transmission compared to a polymer window.
Low kV Performance
The mechanical properties of Si3N4 allow the use of thinly fabricated windows, offering a great benefit in terms of sensitivity and optimal low voltage analysis.
Optimized SDD Electronics
- Fast pulse processing from mapping and quantification
- Optimized data quality at all count rates
- High resolution quantitative analysis at mapping speeds greater than 400,000 output cps
EDAX EDS systems with advanced detection electronics offer the highest throughput count rates on the market for the best possible analysis and increased productivity.
The material properties and durability of Si3N4 ensure the most robust and reliable detectors available for all EDS applications.
The motorized slide on the Octane Elite SDDs offers full control of the detector via the software and is optimal for analytical flexibility. It is ideal for all Focused Ion Beam (FIB) systems.
|125 eV @ Mn K – 123 eV premium
|750 K input cps for ultra fast mapping and particle acquisition
|850 k ocps at 2.0 M icps
|Al L (73 eV) to Am
|Al L to Al K peak height ratio of 1:1 at 2.5 kV
|Standard EDS analysis software
|Fast Phase Mapping routine (patent pending) and materials libraries – Smart Diagnostics – Smart Acquisition – EXpert ID – Smart Mapping – Smart Data Management