Ultim Max is the next generation of Silicon Drift Detectors (SDD) utilising our Extreme electronics to generate maximised sensitivity with increased throughput. This powers AZtecTEM, the market-leading software that delivers unparalleled elemental characterisation performance in the TEM.
- Maximised sensitivity
- Increased throughput
- Stability at elevated temperatures
- New drift correction methodology
- Optimised for biological sample analysis
- M2T quant for sample thickness measurements
- Watch in situ chemistry changes as they happen with AZtecLive
Ultim Max TLE, our flagship SDD detector for TEM. This detector is optimised to offer elemental characterisation at the atomic scale delivering maximum count rates at minimum probe sizes.
This performance is achieved using an optimised shape, 100 mm2 sensor, windowless construction, optimised mechanical design and extreme electronics.
- Solid angle of 0.5 – 1.1 srad
- Up to 8x increase in sensitivity for low energy X-rays
- Quantitative analysis at >400,000 cps
- Collect spectra at specimen temperatures > 1000°C during in situ experiments
Here the technical details for the EDS Ultim Max TLE detector
Ultim Max TEM, our SDD detector for nanoscale analysis and elemental mapping in the TEM.
Using a new low-profile 80 mm2 sensor gets closer to the specimen delivering more x-ray counts under any condition. Combined with a windowless construction and extreme electronics this detector delivers high-performance EDS for 200kV TEMs.
- Solid angle of 0.2 – 0.6 srad
- Up to 8x increase in sensitivity for low energy X-rays
- Quantitative analysis at >400,000 cps
- Collect spectra at specimen temperatures > 1000°C during in situ experiments
Here the technical details for the Ultim Max TEM detector
Qui trovi i MIcroscopi elettronici a Trasmissione
Qui trovi i Microscopi elettronici a Scansione
Qui trovi i MIcroscopi elettronici ricondizionati
Qui trovi tutti i Consumabili di cui hai bisogno
