Oxford EDS X-Max for SEM

Detector EDS Oxford instrumetns, microanalisi per analisi chimica del campione in microscopia elettronica, microscopio elettronico a scansione

The X-MaxN Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of all types of samples including fragile samples and nano-materials.

The X-MaxN Silicon Drift Detector is a 20 mm2 

  • X-MaxN provides a superb resolution that is independent of sensor size – specifications guaranteed to ISO15632:2012
  • The same mechanical geometry inside the microscope means that the count rate simply increases in proportion to sensor size
  • Excellent low energy analysis, including Be detection

Performance independent of size

  • X-MaxN resolution and low energy detectability are independent of sensor size because of its external FET design.
  • The same sensor position means that the count rate simply increases in proportion to sensor size
  • Excellent low energy analysis, including Be detection
  • LN2 not required. X-MaxN is ready to start working in minutes

Benefits

  • Maximise information from the smallest nano-particles and features
  • Quantitative analysis with pulse pile-up correction at many 100s of thousand counts per second
  • Detect low concentrations of minor elements faster
  • Collect X-ray maps using only a few pA on the most unstable samples
  • Maximise information from the smallest nano-particles and features
  • Quantitative analysis with pulse pile-up correction at many 100s of thousand counts per second
  • Detect low concentrations of minor elements faster

The ideal solution for carrying out a complex task like EDS as quickly and as easily as possible.

  • No need for advanced knowledge of the EDS technique – Oxford Instruments’ technology ensures that you can depend on the elements being automatically detected and the correct results being reported
  • Streamlined interface to minimize the number of steps to achieve the right results
    • Users can be trained in a matter of minutes
    • No need for the infrequent user to be retrained every time they need to perform an analysis
    • From image to report in seconds

Here the technical details for the X-Max detector

Qui trovi i Microscopi elettronici a Scansione

Qui trovi i Microscopi elettronici a Trasmissione

Qui trovi i Microscopi elettronici ricondizionati

Qui trovi tutti i Consumabili di cui hai bisogno

Qui trovi i nostri detector EBSD

Qui trovi i nostri detector WDS

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